Isotopic fingerprints of Pt-containing luminescence centers in highly enriched Si-28

Recently we have shown that the reduction in the photoluminescence linewidth of many deep luminescence centers in highly enriched Si-28 results in well-resolved isotopic fingerprints. This allows for a better characterization of a defect center, as not only the involvement of a specific element but...

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Detalles Bibliográficos
Autores principales: Steger, M, Becker, P, Godisov, O N, Alves, E, Kaliteevskii, A K, Saeedi, K, Abrosimov, N V, Churbanov, M F, Gusev, A V, Johnston, K, Thewalt, M L W, Sekiguchi, T, Yang, A, Riemann, H, Henry, M O, Pohl, H -J, Wahl, U
Lenguaje:eng
Publicado: 2010
Materias:
Other Fields of Physics
Acceso en línea:https://dx.doi.org/10.1103/PhysRevB.81.235217
http://cds.cern.ch/record/1359335

Internet

https://dx.doi.org/10.1103/PhysRevB.81.235217
http://cds.cern.ch/record/1359335

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