Test beam results of heavily irradiated magnetic Czochralski silicon (MCz-Si) strip detectors

Strip detectors with an area of 16 cm(2) were processed on high resistivity n-type magnetic Czochralski silicon. In addition, detectors were processed on high resistivity Float Zone wafers with the same mask set for comparison. The detectors were irradiated to several different fluences up to the fl...

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Detalles Bibliográficos
Autores principales: Luukka, P, Tuominen, E, Korjenevski, S, Maenpaa, T, Viljanen, H, Demina, R, Gotra, Y, Lemaitre, V, Moilanen, H, Militaru, O, Bhattacharya, S, Neuland, M, Maksimow, M, Harkonen, J, Kortelainen, M J, Spiegel, L, Hartmann, F, Dierlamm, A, Tuovinen, E, Lampen, T, Simonis, H J, Betchart, B, Czellar, S, Tuominiemi, J, Keutgen, T, Frey, M, Karimaki, V
Lenguaje:eng
Publicado: 2010
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2009.08.017
http://cds.cern.ch/record/1359388

Internet

https://dx.doi.org/10.1016/j.nima.2009.08.017
http://cds.cern.ch/record/1359388

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