Use of IT (current vs temperature) scans to study radiation damage in the LHCb VELO

This note describes the results of a study of radiation damage to the 88 silicon sensors of the VELO, using as input data the periodic current vs temperature (IT) scans. These scans enable the bulk current to be measured precisely and normalised to a given temperature. The change in current induced...

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Detalles Bibliográficos
Autores principales: Hickling, Andrew, Affolder, Tony, Akiba, Kazu, van Beuzekom, Martin, Collins, Paula, Gersabeck, Marco, Jans, Eddy, John, Malcolm, Latham, Thomas, Leflat, Alexander, Parkes, Chris
Lenguaje:eng
Publicado: 2011
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/1392353

Internet

http://cds.cern.ch/record/1392353

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