Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission

A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large sig...

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Detalles Bibliográficos
Autores principales: Seif El Nasr-Storey, Sarah, Detraz, Stephane, Gui, Ping, Menouni, Mohsine, Moreira, Paulo, Papadopoulos, Spyridon, Sigaud, Christophe, Soos, Csaba, Stejskal, Pavel, Troska, Jan, Vasey, Francois
Publicado: 2011
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/TNS.2011.2172632
http://cds.cern.ch/record/1446645

Internet

https://dx.doi.org/10.1109/TNS.2011.2172632
http://cds.cern.ch/record/1446645

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