Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission

A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large sig...

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Detalles Bibliográficos
Autores principales: Seif El Nasr-Storey, Sarah, Detraz, Stephane, Gui, Ping, Menouni, Mohsine, Moreira, Paulo, Papadopoulos, Spyridon, Sigaud, Christophe, Soos, Csaba, Stejskal, Pavel, Troska, Jan, Vasey, Francois
Publicado: 2011
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/TNS.2011.2172632
http://cds.cern.ch/record/1446645
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author Seif El Nasr-Storey, Sarah
Detraz, Stephane
Gui, Ping
Menouni, Mohsine
Moreira, Paulo
Papadopoulos, Spyridon
Sigaud, Christophe
Soos, Csaba
Stejskal, Pavel
Troska, Jan
Vasey, Francois
author_facet Seif El Nasr-Storey, Sarah
Detraz, Stephane
Gui, Ping
Menouni, Mohsine
Moreira, Paulo
Papadopoulos, Spyridon
Sigaud, Christophe
Soos, Csaba
Stejskal, Pavel
Troska, Jan
Vasey, Francois
author_sort Seif El Nasr-Storey, Sarah
collection CERN
description A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large signal caused by a single event transient (SET) in the photodiode.
id cern-1446645
institution Organización Europea para la Investigación Nuclear
publishDate 2011
record_format invenio
spelling cern-14466452019-09-30T06:29:59Zdoi:10.1109/TNS.2011.2172632http://cds.cern.ch/record/1446645Seif El Nasr-Storey, SarahDetraz, StephaneGui, PingMenouni, MohsineMoreira, PauloPapadopoulos, SpyridonSigaud, ChristopheSoos, CsabaStejskal, PavelTroska, JanVasey, FrancoisSingle-event upsets in photoreceivers for Multi-Gb/s SLHC data transmissionDetectors and Experimental TechniquesA 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large signal caused by a single event transient (SET) in the photodiode.oai:cds.cern.ch:14466452011
spellingShingle Detectors and Experimental Techniques
Seif El Nasr-Storey, Sarah
Detraz, Stephane
Gui, Ping
Menouni, Mohsine
Moreira, Paulo
Papadopoulos, Spyridon
Sigaud, Christophe
Soos, Csaba
Stejskal, Pavel
Troska, Jan
Vasey, Francois
Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
title Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
title_full Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
title_fullStr Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
title_full_unstemmed Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
title_short Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
title_sort single-event upsets in photoreceivers for multi-gb/s slhc data transmission
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/TNS.2011.2172632
http://cds.cern.ch/record/1446645
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