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Single-event upsets in photoreceivers for Multi-Gb/s SLHC data transmission
A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large sig...
| Autores principales: | , , , , , , , , , , |
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| Publicado: |
2011
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| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2011.2172632 http://cds.cern.ch/record/1446645 |