Radiation Testing of Electronics for the CMS Endcap Muon System

The electronics used in the data readout and triggering system for the Compact Muon Solenoid (CMS) experiment at the Large Hadron Collider (LHC) particle accelerator at CERN are exposed to high radiation levels. This radiation can cause permanent damage to the electronic circuitry, as well as tempor...

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Detalles Bibliográficos
Autores principales: Bylsma, B., Cady, D., Celik, A., Durkin, L.S., Gilmore, J., Haley, J., Khotilovich, V., Lakdawala, S., Liu, J., Matveev, M., Padley, B.P., Roberts, J., Roe, J., Safonov, A., Suarez, I., Wood, D., Zawisza, I.
Lenguaje:eng
Publicado: 2012
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2012.09.017
http://cds.cern.ch/record/1473793

Internet

https://dx.doi.org/10.1016/j.nima.2012.09.017
http://cds.cern.ch/record/1473793

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