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Reliability wearout mechanisms in advanced CMOS technologies
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Wiley-IEEE Press
2009
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1480741 |
| _version_ | 1780925880007131136 |
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| author | Strong, Alvin Wayne |
| author_facet | Strong, Alvin Wayne |
| author_sort | Strong, Alvin Wayne |
| collection | CERN |
| id | cern-1480741 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2009 |
| publisher | Wiley-IEEE Press |
| record_format | invenio |
| spelling | cern-14807412021-04-22T00:24:01Zhttp://cds.cern.ch/record/1480741engStrong, Alvin WayneReliability wearout mechanisms in advanced CMOS technologiesEngineeringWiley-IEEE Pressoai:cds.cern.ch:14807412009 |
| spellingShingle | Engineering Strong, Alvin Wayne Reliability wearout mechanisms in advanced CMOS technologies |
| title | Reliability wearout mechanisms in advanced CMOS technologies |
| title_full | Reliability wearout mechanisms in advanced CMOS technologies |
| title_fullStr | Reliability wearout mechanisms in advanced CMOS technologies |
| title_full_unstemmed | Reliability wearout mechanisms in advanced CMOS technologies |
| title_short | Reliability wearout mechanisms in advanced CMOS technologies |
| title_sort | reliability wearout mechanisms in advanced cmos technologies |
| topic | Engineering |
| url | http://cds.cern.ch/record/1480741 |
| work_keys_str_mv | AT strongalvinwayne reliabilitywearoutmechanismsinadvancedcmostechnologies |