Transient-induced latchup in CMOS integrated circuits

"Transient-Induced Latchup in CMOS Integrated Circuits equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the c...

Descripción completa

Detalles Bibliográficos
Autores principales: Ker, Ming-Dou, Hsu, Sheng-Fu
Lenguaje:eng
Publicado: Wiley-IEEE Press 2009
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/1480921

Internet

http://cds.cern.ch/record/1480921

Ejemplares similares