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Transmission Electron Microscopy and Diffractometry of Materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2013
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| Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-29761-8 http://cds.cern.ch/record/1493268 |