Single Event Upset Energy Dependence In a Buck-Converter Power Supply Design

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We present a study of Single Event Upsets (SEU) performed on a commercial pulse-width modulator controller chip for switching power supplies. We performed tests to study the probability of an SEU occurring as a function of incident particle (hadron) energy. We discuss the performance of the circuit,...

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Detalles Bibliográficos
Autores principales: Drake, G, De Lurgio, P, Gopalakrishnan, A, Mahadik, S, Mellado, B, Proudfoot, J, Reed, R, Senthilkumaran, A, Stanek, R
Lenguaje:eng
Publicado: 2012
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/1494603

Internet

http://cds.cern.ch/record/1494603

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