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Single Event Upset Energy Dependence In a Buck-Converter Power Supply Design
We present a study of Single Event Upsets (SEU) performed on a commercial pulse-width modulator controller chip for switching power supplies. We performed tests to study the probability of an SEU occurring as a function of incident particle (hadron) energy. We discuss the performance of the circuit,...
| Autores principales: | , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2012
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1494603 |
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