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Variation-Aware Design of Custom Integrated Circuits A Hands-on Field Guide: A Hands-on Field Guide
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. The authors have created a field guide to show how to handle var...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2013
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4614-2269-3 http://cds.cern.ch/record/1500187 |