Cargando…
Process Variations and Probabilistic Integrated Circuit Design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality,...
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
2012
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4419-6621-6 http://cds.cern.ch/record/1503613 |