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System-on-chip test architectures: nanometer design for testability
Autores principales: | Wang, Laung-Terng, Stroud, Charles E, Touba, Nur A |
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Lenguaje: | eng |
Publicado: |
Morgan Kaufmann Publishers
2008
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1512028 |
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