Cargando…
Measurements of the Secondary Electron Emission from Rare Gases at 4.2K
Dependence of the secondary electron yield (SEY) from the primary beam incident energy and the coverage has been measured for neon, argon, krypton and xenon condensed on a target at 4.2K. The beam energy ranged between 100 eV and 3 keV, the maximal applied coverage have made up 12000, 4700, 2500 and...
| Autores principales: | , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2013
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1514932 |