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Amphoteric arsenic in GaN

We have determined the lattice location of implanted arsenic in GaN by means of conversion electron emission channeling from radioactive $^{73}$As. We give direct evidence that As is an amphoteric impurity, thus settling the long-standing question as to whether it prefers cation or anion sites in Ga...

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Detalles Bibliográficos
Autores principales: Wahl, U, Correia, J G, Araújo, J P, Rita, E, Soares, JC
Lenguaje:eng
Publicado: 2007
Materias:
Acceso en línea:https://dx.doi.org/10.1063/1.2736299
http://cds.cern.ch/record/1522407

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