Cargando…
Ellipsometry at the nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
2013
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-33956-1 http://cds.cern.ch/record/1537728 |