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Ellipsometry at the nanoscale

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...

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Detalles Bibliográficos
Autores principales: Losurdo, Maria, Hingerl, Kurt
Lenguaje:eng
Publicado: Springer 2013
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-33956-1
http://cds.cern.ch/record/1537728
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author Losurdo, Maria
Hingerl, Kurt
author_facet Losurdo, Maria
Hingerl, Kurt
author_sort Losurdo, Maria
collection CERN
description This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
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spelling cern-15377282021-04-21T22:49:51Zdoi:10.1007/978-3-642-33956-1http://cds.cern.ch/record/1537728engLosurdo, MariaHingerl, KurtEllipsometry at the nanoscaleEngineeringThis book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springeroai:cds.cern.ch:15377282013
spellingShingle Engineering
Losurdo, Maria
Hingerl, Kurt
Ellipsometry at the nanoscale
title Ellipsometry at the nanoscale
title_full Ellipsometry at the nanoscale
title_fullStr Ellipsometry at the nanoscale
title_full_unstemmed Ellipsometry at the nanoscale
title_short Ellipsometry at the nanoscale
title_sort ellipsometry at the nanoscale
topic Engineering
url https://dx.doi.org/10.1007/978-3-642-33956-1
http://cds.cern.ch/record/1537728
work_keys_str_mv AT losurdomaria ellipsometryatthenanoscale
AT hingerlkurt ellipsometryatthenanoscale