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High precision measurement of the form factors of the semileptonic decays

The data collected by NA48/2 in 2003–2004 allowed several precise measurements in the charged kaon decay sector. In this paper we present the results obtained using a sample of 2.5 × 106 K ± → π 0µ ±ν (Kµ3) and 4.0×106 K ± → π 0 l ±ν (Ke3) events, collected in 2004 using a minimal trigger configurati...

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Detalles Bibliográficos
Autor principal: Lamanna, Gianluca
Lenguaje:eng
Publicado: 2012
Acceso en línea:http://cds.cern.ch/record/1565814