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High precision measurement of the form factors of the semileptonic decays
The data collected by NA48/2 in 2003–2004 allowed several precise measurements in the charged kaon decay sector. In this paper we present the results obtained using a sample of 2.5 × 106 K ± → π 0µ ±ν (Kµ3) and 4.0×106 K ± → π 0 l ±ν (Ke3) events, collected in 2004 using a minimal trigger configurati...
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| Lenguaje: | eng |
| Publicado: |
2012
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| Acceso en línea: | http://cds.cern.ch/record/1565814 |
| Sumario: | The data collected by NA48/2 in 2003–2004 allowed several precise measurements in the charged kaon decay sector. In this paper we present the results obtained using a sample of 2.5 × 106 K ± → π 0µ ±ν (Kµ3) and 4.0×106 K ± → π 0 l ±ν (Ke3) events, collected in 2004 using a minimal trigger configuration. This unbiassed sample of kaon decays allows a high precision measurement of the semileptonic form factors. |
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