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The Chemical Origin of SEY at Technical Surfaces
The secondary emission yield (SEY) properties of colaminated Cu samples for LHC beam screens are correlated to the surface chemical composition determined by X-ray photoelectron spectroscopy. The surface of the "as received" samples is characterized by the presence of significant quantitie...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2013
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2013-002.99 http://cds.cern.ch/record/1567017 |