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Firmware Design for a SEU test system
In this report the firmware design of the new upgraded SEU chip is presented. A single event upset (SEU) is a change of state in memory cells or registers in microelectronic devices caused by ionizing particles. The state change is a result of the free charge created by ionization in a sensitive no...
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| Lenguaje: | eng |
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2013
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| Acceso en línea: | http://cds.cern.ch/record/1594978 |