Firmware Design for a SEU test system

In this report the firmware design of the new upgraded SEU chip is presented. A single event upset (SEU) is a change of state in memory cells or registers in microelectronic devices caused by ionizing particles. The state change is a result of the free charge created by ionization in a sensitive node of the circuit. The code is written and simulate in verilog using ISE version 14.1. If there will be any change in the state of the memory it will be detected through the code.