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Digital circuit testing: a guide to DFT and other techniques

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electron...

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Detalles Bibliográficos
Autor principal: Wong, Francis C
Lenguaje:eng
Publicado: Elsevier 1991
Materias:
Acceso en línea:http://cds.cern.ch/record/1601193