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Digital circuit testing: a guide to DFT and other techniques
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electron...
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| Lenguaje: | eng |
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Elsevier
1991
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| Acceso en línea: | http://cds.cern.ch/record/1601193 |