Single Event Upset Studies Using the ATLAS SCT

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Single Event Upsets (SEU) are expected to occur during high luminosity running of the ATLAS SemiConductor Tracker (SCT). The SEU cross sections were measured in pion beams with momenta in the range 200 to 465 MeV/c and proton test beams at 24 GeV/c but the extrapolation to LHC conditions is non-triv...

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Detalles Bibliográficos
Autor principal: Weidberg, A R
Lenguaje:eng
Publicado: 2013
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/1601799

Internet

http://cds.cern.ch/record/1601799

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