Cargando…
Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
The article addresses production test development effort of the ATLAS FE-I4 integrated circuit. This particular production test targets manufacturing faults in the ICs and has been taken as a supplementary approach, besides standard functional test, to further decrease the risk of potential applicat...
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2013
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/8/02/C02003 http://cds.cern.ch/record/1609028 |