Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications

The article addresses production test development effort of the ATLAS FE-I4 integrated circuit. This particular production test targets manufacturing faults in the ICs and has been taken as a supplementary approach, besides standard functional test, to further decrease the risk of potential applicat...

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Detalles Bibliográficos
Autores principales: Zivkovic, V A, Porret, D
Lenguaje:eng
Publicado: 2013
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/8/02/C02003
http://cds.cern.ch/record/1609028
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author Zivkovic, V A
Porret, D
author_facet Zivkovic, V A
Porret, D
author_sort Zivkovic, V A
collection CERN
description The article addresses production test development effort of the ATLAS FE-I4 integrated circuit. This particular production test targets manufacturing faults in the ICs and has been taken as a supplementary approach, besides standard functional test, to further decrease the risk of potential application failures. The Design-for-Test structures inside the digital part of the chip, together with the specially devised top-level simulations enabled straightforward test development and debug in the production test environment. The production test itself has been commissioned to the external test company, with the supervision of the FE-I4 team at the test floor.
id cern-1609028
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2013
record_format invenio
spelling cern-16090282019-09-30T06:29:59Zdoi:10.1088/1748-0221/8/02/C02003http://cds.cern.ch/record/1609028engZivkovic, V APorret, DProduction test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applicationsDetectors and Experimental TechniquesThe article addresses production test development effort of the ATLAS FE-I4 integrated circuit. This particular production test targets manufacturing faults in the ICs and has been taken as a supplementary approach, besides standard functional test, to further decrease the risk of potential application failures. The Design-for-Test structures inside the digital part of the chip, together with the specially devised top-level simulations enabled straightforward test development and debug in the production test environment. The production test itself has been commissioned to the external test company, with the supervision of the FE-I4 team at the test floor.oai:cds.cern.ch:16090282013
spellingShingle Detectors and Experimental Techniques
Zivkovic, V A
Porret, D
Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
title Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
title_full Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
title_fullStr Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
title_full_unstemmed Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
title_short Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications
title_sort production test engineering in fe-i4 system-on-chip to boost the reliability and high-quality demands in ibl applications
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/8/02/C02003
http://cds.cern.ch/record/1609028
work_keys_str_mv AT zivkovicva productiontestengineeringinfei4systemonchiptoboostthereliabilityandhighqualitydemandsiniblapplications
AT porretd productiontestengineeringinfei4systemonchiptoboostthereliabilityandhighqualitydemandsiniblapplications

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