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Effect of Temperature and Charged Particle Fluence on the Resistivity of Polycrystalline CVD Diamond Sensors

The resistivity of polycrystalline chemical vapor deposition diamond sensors is studied in samples exposed to fluences relevant to the environment of the High Luminosity Large Hadron Collider. We measure the leakage current for a range of bias voltages on samples irradiated with 800 MeV protons up t...

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Detalles Bibliográficos
Autores principales: Wang, Rui, Hoeferkamp, Martin, Seidel, Sally
Lenguaje:eng
Publicado: 2013
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2013.10.007
http://cds.cern.ch/record/1609137