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Mismatch and noise in modern IC processes
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated circuits, from the perspe...
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| Lenguaje: | eng |
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Morgan & Claypool Publishers
2009
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| Acceso en línea: | http://cds.cern.ch/record/1614196 |