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International Symposium on Materials and Measurements in Molecular Electronics
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
1996
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-4-431-68470-1 http://cds.cern.ch/record/1627281 |