Cargando…
4th International Conference on Secondary Ion Mass Spectrometry
Autores principales: | Benninghoven, A, Okano, J, Shimizu, R, Werner, H |
---|---|
Lenguaje: | eng |
Publicado: |
Springer
1984
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-82256-8 http://cds.cern.ch/record/1627342 |
Ejemplares similares
-
5th International Conference on Secondary Ion Mass Spectrometry
por: Benninghoven, Alfred, et al.
Publicado: (1986) -
2nd International Conference on Secondary Ion Mass Spectrometry
por: Benninghoven, A, et al.
Publicado: (1979) -
3rd International Conference on Secondary Ion Mass Spectrometry
por: Benninghoven, A, et al.
Publicado: (1982) -
11th International Mass Spectrometry Conference
por: Longevialle, P
Publicado: (1988) -
4th International Conference on the Physics of Multiply-charged Ions
por: Bliman, S
Publicado: (1988)