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Particle image velocimetry: progress towards industrial application
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2000
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-94-017-2543-9 http://cds.cern.ch/record/1629233 |