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Particle image velocimetry: progress towards industrial application
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2000
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-94-017-2543-9 http://cds.cern.ch/record/1629233 |
| _version_ | 1780934119942782976 |
|---|---|
| author | Stanislas, M Kompenhans, J Westerweel, J |
| author_facet | Stanislas, M Kompenhans, J Westerweel, J |
| author_sort | Stanislas, M |
| collection | CERN |
| id | cern-1629233 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2000 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-16292332021-04-21T21:33:51Zdoi:10.1007/978-94-017-2543-9http://cds.cern.ch/record/1629233engStanislas, MKompenhans, JWesterweel, JParticle image velocimetry: progress towards industrial applicationEngineeringSpringeroai:cds.cern.ch:16292332000 |
| spellingShingle | Engineering Stanislas, M Kompenhans, J Westerweel, J Particle image velocimetry: progress towards industrial application |
| title | Particle image velocimetry: progress towards industrial application |
| title_full | Particle image velocimetry: progress towards industrial application |
| title_fullStr | Particle image velocimetry: progress towards industrial application |
| title_full_unstemmed | Particle image velocimetry: progress towards industrial application |
| title_short | Particle image velocimetry: progress towards industrial application |
| title_sort | particle image velocimetry: progress towards industrial application |
| topic | Engineering |
| url | https://dx.doi.org/10.1007/978-94-017-2543-9 http://cds.cern.ch/record/1629233 |
| work_keys_str_mv | AT stanislasm particleimagevelocimetryprogresstowardsindustrialapplication AT kompenhansj particleimagevelocimetryprogresstowardsindustrialapplication AT westerweelj particleimagevelocimetryprogresstowardsindustrialapplication |