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5th International Congress on X-Ray Optics and Microanalysis
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
1969
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-662-12108-5 http://cds.cern.ch/record/1630588 |