Status Report from the Fifth International Conference on X-Ray Microscopy and Spectromicroscopy

Detalles Bibliográficos
Autores principales: Thieme, Jürgen, Schmahl, Günter, Rudolph, Dietbert, Umbach, Eberhard
Lenguaje:eng
Publicado: Springer 1998
Materias:
Other Fields of Physics
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-72106-9
http://cds.cern.ch/record/1635180

Internet

https://dx.doi.org/10.1007/978-3-642-72106-9
http://cds.cern.ch/record/1635180

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