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25th International Conference on Defects in Semiconductors

Detalles Bibliográficos
Autores principales:	Bagraev, Nikolay T, Emtsev, Vadim V, Estreicher, Stefan K
Lenguaje:	eng
Publicado:	2009
Materias:	Condensed Matter
Acceso en línea:	http://cds.cern.ch/record/1640956

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