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NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
1980
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4757-1126-4 http://cds.cern.ch/record/1641239 |