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Wire bonding in microelectronics

Wire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge t...

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Autor principal: Harman, George G
Lenguaje:eng
Publicado: McGraw-Hill 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/1644564
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author Harman, George G
author_facet Harman, George G
author_sort Harman, George G
collection CERN
description Wire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge techniques. In addition to gaining a full grasp of bonding technology, you'll learn how to create reliable bonds at exceedingly high yields, test wire bonds, solve common bonding problems, implement molecular cleaning methods, and much more. Coverage includes: Ultrasonic bonding systems and technologies, including high-frequency systems Bonding wire metallurgy and characteristics, including copper wire Wire bond testing Gold-aluminum intermetallic compounds and other interface reactions Gold and nickel-based bond pad plating materials and problems Cleaning to improve bondability and reliability Mechanical problems in wire bonding High-yield, fine-pitch, specialized-looping, soft-substrate, and extreme-temperature wire bonds Copper, low-dielectric-constant (Cu/Lo-k) technology and problems Wire bonding process modeling and simulation CD includes all of the book's full-color figures plus animations.
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spelling cern-16445642021-04-21T21:21:18Zhttp://cds.cern.ch/record/1644564engHarman, George GWire bonding in microelectronicsEngineeringWire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge techniques. In addition to gaining a full grasp of bonding technology, you'll learn how to create reliable bonds at exceedingly high yields, test wire bonds, solve common bonding problems, implement molecular cleaning methods, and much more. Coverage includes: Ultrasonic bonding systems and technologies, including high-frequency systems Bonding wire metallurgy and characteristics, including copper wire Wire bond testing Gold-aluminum intermetallic compounds and other interface reactions Gold and nickel-based bond pad plating materials and problems Cleaning to improve bondability and reliability Mechanical problems in wire bonding High-yield, fine-pitch, specialized-looping, soft-substrate, and extreme-temperature wire bonds Copper, low-dielectric-constant (Cu/Lo-k) technology and problems Wire bonding process modeling and simulation CD includes all of the book's full-color figures plus animations.McGraw-Hilloai:cds.cern.ch:16445642010
spellingShingle Engineering
Harman, George G
Wire bonding in microelectronics
title Wire bonding in microelectronics
title_full Wire bonding in microelectronics
title_fullStr Wire bonding in microelectronics
title_full_unstemmed Wire bonding in microelectronics
title_short Wire bonding in microelectronics
title_sort wire bonding in microelectronics
topic Engineering
url http://cds.cern.ch/record/1644564
work_keys_str_mv AT harmangeorgeg wirebondinginmicroelectronics