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Wire bonding in microelectronics
Wire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge t...
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Lenguaje: | eng |
Publicado: |
McGraw-Hill
2010
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Acceso en línea: | http://cds.cern.ch/record/1644564 |
_version_ | 1780935048282767360 |
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author | Harman, George G |
author_facet | Harman, George G |
author_sort | Harman, George G |
collection | CERN |
description | Wire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge techniques. In addition to gaining a full grasp of bonding technology, you'll learn how to create reliable bonds at exceedingly high yields, test wire bonds, solve common bonding problems, implement molecular cleaning methods, and much more. Coverage includes: Ultrasonic bonding systems and technologies, including high-frequency systems Bonding wire metallurgy and characteristics, including copper wire Wire bond testing Gold-aluminum intermetallic compounds and other interface reactions Gold and nickel-based bond pad plating materials and problems Cleaning to improve bondability and reliability Mechanical problems in wire bonding High-yield, fine-pitch, specialized-looping, soft-substrate, and extreme-temperature wire bonds Copper, low-dielectric-constant (Cu/Lo-k) technology and problems Wire bonding process modeling and simulation CD includes all of the book's full-color figures plus animations. |
id | cern-1644564 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2010 |
publisher | McGraw-Hill |
record_format | invenio |
spelling | cern-16445642021-04-21T21:21:18Zhttp://cds.cern.ch/record/1644564engHarman, George GWire bonding in microelectronicsEngineeringWire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge techniques. In addition to gaining a full grasp of bonding technology, you'll learn how to create reliable bonds at exceedingly high yields, test wire bonds, solve common bonding problems, implement molecular cleaning methods, and much more. Coverage includes: Ultrasonic bonding systems and technologies, including high-frequency systems Bonding wire metallurgy and characteristics, including copper wire Wire bond testing Gold-aluminum intermetallic compounds and other interface reactions Gold and nickel-based bond pad plating materials and problems Cleaning to improve bondability and reliability Mechanical problems in wire bonding High-yield, fine-pitch, specialized-looping, soft-substrate, and extreme-temperature wire bonds Copper, low-dielectric-constant (Cu/Lo-k) technology and problems Wire bonding process modeling and simulation CD includes all of the book's full-color figures plus animations.McGraw-Hilloai:cds.cern.ch:16445642010 |
spellingShingle | Engineering Harman, George G Wire bonding in microelectronics |
title | Wire bonding in microelectronics |
title_full | Wire bonding in microelectronics |
title_fullStr | Wire bonding in microelectronics |
title_full_unstemmed | Wire bonding in microelectronics |
title_short | Wire bonding in microelectronics |
title_sort | wire bonding in microelectronics |
topic | Engineering |
url | http://cds.cern.ch/record/1644564 |
work_keys_str_mv | AT harmangeorgeg wirebondinginmicroelectronics |