Cargando…
Semiconductor X-ray detectors
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
CRC Press
2014
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1665155 |