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Fault-tolerance techniques for SRAM-based FPGAs
Fault-tolerance in integrated circuits is no longer the exclusive concern of space designers or highly-reliable applications engineers. Today, designers of many next-generation products must cope with reduced margin noises. The continuous evolution of fabrication technology of semiconductor compone...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2006
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1666884 |