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Perspectives of 65 nm CMOS technologies for high performance front-end electronics
The 65 nm CMOS generation is currently being evaluated as a promising solution for the integration of high speed circuits with high functional density in a small pixel. This technology node has specific features, such as new materials introduced to limit the current tunneling through the thin dielec...
| Autores principales: | , , , , |
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| Formato: | info:eu-repo/semantics/article |
| Lenguaje: | eng |
| Publicado: |
2014
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1693462 |