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Electrical design of Through Silicon Via

Through Silicon Via (TSV) is a key technology for realizing three-dimensional integrated circuits (3D ICs) for future high-performance and low-power systems with small form factors. This book covers both qualitative and quantitative approaches to give insights of modeling TSV in a various viewpoints...

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Detalles Bibliográficos
Autores principales: Lee, Manho, Pak, Jun, Kim, Joungho
Lenguaje:eng
Publicado: Springer 2014
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-94-017-9038-3
http://cds.cern.ch/record/1707498