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Electrical design of Through Silicon Via
Through Silicon Via (TSV) is a key technology for realizing three-dimensional integrated circuits (3D ICs) for future high-performance and low-power systems with small form factors. This book covers both qualitative and quantitative approaches to give insights of modeling TSV in a various viewpoints...
Autores principales: | Lee, Manho, Pak, Jun, Kim, Joungho |
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Lenguaje: | eng |
Publicado: |
Springer
2014
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-94-017-9038-3 http://cds.cern.ch/record/1707498 |
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