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Fringe pattern analysis for optical metrology: theory, algorithms, and applications
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Wiley
2014
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1735382 |