Fringe pattern analysis for optical metrology: theory, algorithms, and applications

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Detalles Bibliográficos
Autores principales: Servin, Manuel, Quiroga, J Antonio, Padilla, Moises
Lenguaje:eng
Publicado: Wiley 2014
Materias:
Other Fields of Physics
Acceso en línea:http://cds.cern.ch/record/1735382
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author Servin, Manuel
Quiroga, J Antonio
Padilla, Moises
author_facet Servin, Manuel
Quiroga, J Antonio
Padilla, Moises
author_sort Servin, Manuel
collection CERN
description The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2014
publisher Wiley
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spelling cern-17353822021-04-21T20:57:33Zhttp://cds.cern.ch/record/1735382engServin, ManuelQuiroga, J AntonioPadilla, MoisesFringe pattern analysis for optical metrology: theory, algorithms, and applicationsOther Fields of PhysicsThe main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties suchWileyoai:cds.cern.ch:17353822014
spellingShingle Other Fields of Physics
Servin, Manuel
Quiroga, J Antonio
Padilla, Moises
Fringe pattern analysis for optical metrology: theory, algorithms, and applications
title Fringe pattern analysis for optical metrology: theory, algorithms, and applications
title_full Fringe pattern analysis for optical metrology: theory, algorithms, and applications
title_fullStr Fringe pattern analysis for optical metrology: theory, algorithms, and applications
title_full_unstemmed Fringe pattern analysis for optical metrology: theory, algorithms, and applications
title_short Fringe pattern analysis for optical metrology: theory, algorithms, and applications
title_sort fringe pattern analysis for optical metrology: theory, algorithms, and applications
topic Other Fields of Physics
url http://cds.cern.ch/record/1735382
work_keys_str_mv AT servinmanuel fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications
AT quirogajantonio fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications
AT padillamoises fringepatternanalysisforopticalmetrologytheoryalgorithmsandapplications

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