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Terrestrial radiation effects in ULSI devices and electronic systems
A practical guide on how mathematical approaches can be used to analyze and control radiation effects in semiconductor devices within various environments Covers faults in ULSI devices to failures in electronic systems caused by a wide variety of radiation fields, including electrons, alpha -rays,...
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| Lenguaje: | eng |
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Wiley-IEEE Press
2014
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| Acceso en línea: | http://cds.cern.ch/record/1752150 |