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Applied metrology for LEP ; pt 1, computing and analysis methods
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| Lenguaje: | eng |
| Publicado: |
CERN
1987
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-1987-001.233 http://cds.cern.ch/record/185437 |