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Debug automation from pre-silicon to post-silicon

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated d...

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Detalles Bibliográficos
Autores principales: Dehbashi, Mehdi, Fey, Görschwin
Lenguaje:eng
Publicado: Springer 2015
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-09309-3
http://cds.cern.ch/record/1968673